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Researchers based at I*PROMS partner and associate partner institutions are invited to take part in the I*PROMS Researchers Symposium which will take place in Cardiff, UK on 1st - 3rd July 2008.

The aim of the Symposium is to promote communication and collaboration among the I*PROMS community by providing an opportunity for I*PROMS researchers, including those from associate partner institutions, to present their work. The contribution of I*PROMS researchers has been evident in the outputs submitted by the network and presented by partner institutions. However, we would now like to provide the chance to all our researchers from I*PROMS partner and associate partner institutions, many of whom have been operating in the background, to step forward and present their work.

The Symposium will bring people at different levels of experience together to facilitate dissemination among the I*PROMS community of information on the work being done within the network. This is intended to lead to freer communication and closer collaboration between all partners, as well as increase the scope of knowledge exchange by involving a wider group of people. The Symposium is ideal for both regular contributors and those without previous involvement in network activities.

The following will take place during the Symposium:

• Presentations of selected IPROMS 2008 papers.
• Presentations (oral and poster) of research not reported at IPROMS 2008.
• Showcasing of I*PROMS Technology Demonstrators
• Tutorials and short courses.

In addition, there will be presentations on the activities and achievements of the Network, and ample opportunities for informal networking and discussion of ideas for collaboration on existing and future joint projects.

To register, click on the register tab found at the top of this page, please note you will need to be logged in to register.

Download Researcher Symposium flyer

Tutorials

Intelligent Inspection

The intelligent inspection tutorial will cover the following topics: artificial intelligence and automated inspection; image acquisition and enhancement; segmentation and feature extraction; classification, case studies and future of automated visual inspection (AVI); Siemens ProVision guide; and Siemens ProVision practical session.

The intelligent inspection tutorial will be presented by Dr Robert J Alcock. He completed a PhD in Machine Vision at Cardiff University in 1996. Subsequently, he worked as a Senior Research Associate at the Manufacturing Engineering Centre, Cardiff University (www.mec.cf.ac.uk) and as a visiting researcher at Aristotle University of Thessaloniki (delab.csd.auth.gr). In 2000, he joined Metropolis Informatics S.A. (www.metropolis.com.gr) and has worked on Machine Vision projects in the USA and Europe. He also worked as the Technical Co-ordinator at the University of Macedonia and at present he is providing IT Support at the University Hospital, Thessaloniki. He is co-author of the book “Smart Inspection Systems: Techniques and Applications of Intelligent Vision” published by Elsevier (http://www.elsevier.com/wps/find/bookdescription.cws_home/699968/description#description). This book includes a CD-ROM containing a demonstration version of the ProVision image processing tool from Siemens. The tutorial will be based on this book.

Atomic Force Microscopy

The Atomic Force Microscopy (AFM) tutorial will cover the following topics: basic principles, imaging modes, applications and a demonstration session.

The AFM tutorial will be presented by Dr Emmanuel Brousseau. He completed a PhD in Computer-Aided Design and Computer-Aided Manufacture at Cardiff University in 2004. Subsequently, he worked as a Research Fellow at the Manufacturing Engineering Centre, Cardiff University (www.mec.cf.ac.uk) in micro-manufacturing. During this time he investigated metrology techniques for dimensional measurements and surface characterisation of micro-components. In 2007 he was awarded the Research Councils UK (RCUK) Academic Fellowship for conducting research, commercialisation and exploitation in micro manufacturing and micro/nano technologies.

TRIZ

TRIZ is a Russian acronym that translates to "The theory of solving inventor's problems" or "The theory of inventor's problem solving". It was developed by a Soviet engineer and researcher Genrich Altshuller and his colleagues starting in 1946.

Today, TRIZ is a methodology, tool set, knowledge base, and model-based technology for generating innovative ideas and solutions for problem solving. TRIZ provides tools and methods for use in problem formulation, system analysis, failure analysis, and patterns of system evolution (both 'as-is' and 'could be'). TRIZ, in contrast to techniques such as brainstorming (which is based on random idea generation), aims to create an algorithmic approach to the invention of new systems, and the refinement of old systems.

This tutorial will be presented by Darrell Mann of Systematic Innovation and will provide a brief introduction to TRIZ and its applications.

Research Skills

The Research Skills session aims to introduce the participants to a wide range of mind techniques and tools that are essential for generating and implementing new ideas and strategies. They include:

• tools for creative thinking such as brainstorming,
• tools for understanding complex situations (e.g. SWOT),
• techniques for effective decision making,
• skills for project planning and time management,
• communication skills and
• research methodology and scientific writing (paper and thesis).